Detail publikace

Simulation of the cantilever used as a weak force sensor in Atomic Force Microscopy

HROUZEK, M.

Originální název

Simulation of the cantilever used as a weak force sensor in Atomic Force Microscopy

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

New types of weak forces measurements with Atomic Force Microscope (AFM) are very challenging for experimental physics and call for new studies about controllers operating the AFM. For the development of improved regulators applied into control systems is needed precise model of the cantilever with a sharp tip, as a detection system, and its interaction with the scanned sample. This paper presents a model of the cantilever, that is based at the beam theory with the in°uence of the long distance interaction forces.

Klíčová slova v angličtině

cantilever, weak force, sensor

Autoři

HROUZEK, M.

Rok RIV

2004

Vydáno

1. 1. 2004

Nakladatel

VUT v Brně, Antonínská 548/1

Místo

Brno

ISBN

80-214-2701-9

Kniha

ELECTRONIC DEVICES AND SYSTEMS 04 - PROCEEDINGS

Edice

1

Číslo edice

1

Strany od

1

Strany do

5

Strany počet

5

BibTex

@inproceedings{BUT11551,
  author="Michal {Hrouzek}",
  title="Simulation of the cantilever used as a weak force sensor in Atomic Force Microscopy",
  booktitle="ELECTRONIC DEVICES AND SYSTEMS 04 - PROCEEDINGS",
  year="2004",
  series="1",
  number="1",
  pages="5",
  publisher="VUT v Brně, Antonínská 548/1",
  address="Brno",
  isbn="80-214-2701-9"
}