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PTÁČEK, K. BURTON, R.
Patent type
Patent
Abstract
In accordance with an embodiment, an electrical element includes a first portion of a first dielectric material between a first portion of a first electrical conductor and a first portion of a second electrical conductor and a second portion of the first dielectric material between a second portion of the first electrical conductor and a first portion of a third electrical conductor. In accordance with another embodiment, a method includes forming a first electrically conductive structure over a first portion of the first layer of dielectric material and forming a second electrically conductive structure over a second portion of the first layer of dielectric material. A second layer of dielectric material is formed over the first electrically conductive structure and a third electrically conductive structure over the second layer of dielectric material, wherein the third electrically conductive structure is over portions of the first and second electrically conductive structures.
Keywords
monolithic; capacitor; demagnetization; sensor; capacitive coupling; on-chip; isolation
Patent number
20150287774
Date of application
20. 3. 2015
Date of registration
8. 10. 2015
Owner
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Possibilities of use
In order to use the result by another entity, it is always necessary to acquire a license
Licence fee
The licensor requires a license fee for the result
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