Publication detail

The Test Controller Model Based on The Timed Automaton

MIKA, D. KOTÁSEK, Z.

Original Title

The Test Controller Model Based on The Timed Automaton

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

In the paper the process of the test controller model design and synthesis on Register Transfer Level (RTL) is described. The principles of test application to circuit element by the test controller model is discussed. The problem of I-path is explained. The formal tool - the timed automaton - is used as a suitable tool for test controller model. In the end of paper there is a simple example of timed automaton, which represents a model of particular behavior of the test controller.

Keywords

Register Transfer Level (RTL), Circuit Under Test (CUT), Test Controller Model

Authors

MIKA, D.; KOTÁSEK, Z.

RIV year

2003

Released

28. 4. 2003

Location

Ostrava

ISBN

80-85988-86-0

Book

Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems

Pages from

107

Pages to

114

Pages count

8

BibTex

@inproceedings{BUT13967,
  author="Daniel {Mika} and Zdeněk {Kotásek}",
  title="The Test Controller Model Based on The Timed Automaton",
  booktitle="Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems",
  year="2003",
  pages="107--114",
  address="Ostrava",
  isbn="80-85988-86-0"
}