Detail publikace

The Test Controller Model Based on The Timed Automaton

MIKA, D. KOTÁSEK, Z.

Originální název

The Test Controller Model Based on The Timed Automaton

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

In the paper the process of the test controller model design andsynthesis on Register Transfer Level (RTL) is described. The principlesof test application to circuit element by the test controller model isdiscussed. The problem of I-path is explained. The formal tool - thetimed automaton - is used as a suitable tool for test controller model.In the end of paper there is a simple example of timed automaton, whichrepresents a model of particular behavior of the test controller.

Klíčová slova

Register Transfer Level (RTL), Circuit Under Test (CUT), Test Controller Model

Autoři

MIKA, D.; KOTÁSEK, Z.

Rok RIV

2003

Vydáno

28. 4. 2003

Místo

Ostrava

ISBN

80-85988-86-0

Kniha

Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems

Strany od

107

Strany do

114

Strany počet

8

BibTex

@inproceedings{BUT13967,
  author="Daniel {Mika} and Zdeněk {Kotásek}",
  title="The Test Controller Model Based on The Timed Automaton",
  booktitle="Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems",
  year="2003",
  pages="107--114",
  address="Ostrava",
  isbn="80-85988-86-0"
}