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TALU, S. SOBOLA, D. TOMÁNEK, P. STACH, S.
Original Title
Micromorphology of AlN Epilayers on Sapphire Substrates
Type
conference paper
Language
English
Original Abstract
The purpose of this paper was to describe the 3D nano-scaled surface topography of the aluminum nitride on sapphire. The structures were prepared by magnetron sputtering with heating of the sapphire substrate. The dependence of the layers topography on the substrate temperature was presented. Surface appearance was studied by atomic force microscopy (AFM). The quantitative topography data from AFM were used for surface characterization by fractal analysis and statistical parameters. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. The data may contribute to manufacture of AlN thin films with desired surface characteristics.
Keywords
Aluminum nitride, Atomic force microscopy, Fractal analysis, Minkowsky functionals, Surface micromorphology
Authors
TALU, S.; SOBOLA, D.; TOMÁNEK, P.; STACH, S.
Released
20. 10. 2017
Publisher
DEStech Publications, Inc.
Location
439 North Duke Street Lancaster, Pennsylvania 17602 U.S.A.
ISBN
978-1-60595-476-9
Book
DEStech Transactions on Computer Science and Engineering
Edition
Proceedings CECE 2017
2475-8841
Periodical
State
United States of America
Pages from
465
Pages to
470
Pages count
6
URL
http://dpi-proceedings.com/index.php/dtcse/issue/view/157
BibTex
@inproceedings{BUT140588, author="Stefan {Talu} and Dinara {Sobola} and Pavel {Tománek} and Sebastian {Stach}", title="Micromorphology of AlN Epilayers on Sapphire Substrates", booktitle="DEStech Transactions on Computer Science and Engineering", year="2017", series="Proceedings CECE 2017", journal="DEStech Transactions on Computer Science and Engineering", pages="465--470", publisher="DEStech Publications, Inc.", address="439 North Duke Street Lancaster, Pennsylvania 17602 U.S.A.", doi="10.12783/dtcse/cece2017/14582", isbn="978-1-60595-476-9", issn="2475-8841", url="http://dpi-proceedings.com/index.php/dtcse/issue/view/157" }