Publication detail

Hybrid architecture of microcode memory Built-In Self Test

VYKYDAL, L.

Original Title

Hybrid architecture of microcode memory Built-In Self Test

Type

journal article - other

Language

English

Original Abstract

March tests are a popular method to test semiconductor memory for defects, but they’re originally designed to only work on bit-oriented memories. For practical use march tests have been extended for use on word-oriented memories. This extension is done by either using multiple test data vectors and their inversions, or by using serial march test. These tests access each data word in memory as a shift register. This paper is proposing a microcode-controlled built-in self test architecture that allows us to use both access methods during a single test.

Keywords

memory BIST, march algorithm, memory testing

Authors

VYKYDAL, L.

Released

30. 4. 2018

Publisher

Electrorevue

ISBN

1213-1539

Periodical

Elektrorevue - Internetový časopis (http://www.elektrorevue.cz)

Year of study

20

Number

2

State

Czech Republic

Pages from

36

Pages to

41

Pages count

6

URL

http://www.elektrorevue.cz/cz/clanky/informacni-technologie/0/hybrid-architecture-of-microcode-memory-built-in-self-test/

BibTex

@article{BUT147201,
  author="Lukáš {Vykydal}",
  title="Hybrid architecture of microcode memory Built-In Self Test",
  journal="Elektrorevue - Internetový časopis (http://www.elektrorevue.cz)",
  year="2018",
  volume="20",
  number="2",
  pages="36--41",
  issn="1213-1539",
  url="http://www.elektrorevue.cz/cz/clanky/informacni-technologie/0/hybrid-architecture-of-microcode-memory-built-in-self-test/"
}