Detail publikace

Hybrid architecture of microcode memory Built-In Self Test

VYKYDAL, L.

Originální název

Hybrid architecture of microcode memory Built-In Self Test

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

March tests are a popular method to test semiconductor memory for defects, but they’re originally designed to only work on bit-oriented memories. For practical use march tests have been extended for use on word-oriented memories. This extension is done by either using multiple test data vectors and their inversions, or by using serial march test. These tests access each data word in memory as a shift register. This paper is proposing a microcode-controlled built-in self test architecture that allows us to use both access methods during a single test.

Klíčová slova

memory BIST, march algorithm, memory testing

Autoři

VYKYDAL, L.

Vydáno

30. 4. 2018

Nakladatel

Electrorevue

ISSN

1213-1539

Periodikum

Elektrorevue - Internetový časopis (http://www.elektrorevue.cz)

Ročník

20

Číslo

2

Stát

Česká republika

Strany od

36

Strany do

41

Strany počet

6

URL

http://www.elektrorevue.cz/cz/clanky/informacni-technologie/0/hybrid-architecture-of-microcode-memory-built-in-self-test/

BibTex

@article{BUT147201,
  author="Lukáš {Vykydal}",
  title="Hybrid architecture of microcode memory Built-In Self Test",
  journal="Elektrorevue - Internetový časopis (http://www.elektrorevue.cz)",
  year="2018",
  volume="20",
  number="2",
  pages="36--41",
  issn="1213-1539",
  url="http://www.elektrorevue.cz/cz/clanky/informacni-technologie/0/hybrid-architecture-of-microcode-memory-built-in-self-test/"
}