Publication detail

Usage of low cost digital camera for detecting of silicon solar cell electroluminiscence

LEPÍK, P. VANĚK, J.

Original Title

Usage of low cost digital camera for detecting of silicon solar cell electroluminiscence

Type

conference paper

Language

English

Original Abstract

This article analyses the existing methods both practically and theoretically used to detect defected surface area in solar cells. Various methods were used but by using an upgraded camera with CMOS sensor for carrying out the electroluminescence method, this has proven to have a very crucial impact on the results. Given the overall results and the acquired information, a procedure with a simple parameter can be setup to carry out the measurements. In addition to this a catalog was formed showing the defects occurring in mono and polycrystalline solar cells.

Keywords

CMOS camera, defect detection, diagnostic methods, electroluminescence, photovoltaics, photovoltaic cell, solar cell, silicon

Authors

LEPÍK, P.; VANĚK, J.

Released

28. 4. 2018

Publisher

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiíí

Location

Brno

ISBN

978-80-214-5614-3

Book

Proceedings of the 24th Conference STUDENT EEICT 2018

Edition

1

Edition number

1

Pages from

574

Pages to

578

Pages count

5

URL

BibTex

@inproceedings{BUT149972,
  author="Pavel {Lepík} and Jiří {Vaněk}",
  title="Usage of low cost digital camera for detecting of silicon solar cell electroluminiscence",
  booktitle="Proceedings of the 24th Conference STUDENT EEICT 2018",
  year="2018",
  series="1",
  number="1",
  pages="574--578",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiíí",
  address="Brno",
  isbn="978-80-214-5614-3",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2018_sbornik.pdf"
}