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LEPÍK, P. VANĚK, J.
Original Title
Usage of low cost digital camera for detecting of silicon solar cell electroluminiscence
Type
conference paper
Language
English
Original Abstract
This article analyses the existing methods both practically and theoretically used to detect defected surface area in solar cells. Various methods were used but by using an upgraded camera with CMOS sensor for carrying out the electroluminescence method, this has proven to have a very crucial impact on the results. Given the overall results and the acquired information, a procedure with a simple parameter can be setup to carry out the measurements. In addition to this a catalog was formed showing the defects occurring in mono and polycrystalline solar cells.
Keywords
CMOS camera, defect detection, diagnostic methods, electroluminescence, photovoltaics, photovoltaic cell, solar cell, silicon
Authors
LEPÍK, P.; VANĚK, J.
Released
28. 4. 2018
Publisher
Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiíí
Location
Brno
ISBN
978-80-214-5614-3
Book
Proceedings of the 24th Conference STUDENT EEICT 2018
Edition
1
Edition number
Pages from
574
Pages to
578
Pages count
5
URL
https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2018_sbornik.pdf
BibTex
@inproceedings{BUT149972, author="Pavel {Lepík} and Jiří {Vaněk}", title="Usage of low cost digital camera for detecting of silicon solar cell electroluminiscence", booktitle="Proceedings of the 24th Conference STUDENT EEICT 2018", year="2018", series="1", number="1", pages="574--578", publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiíí", address="Brno", isbn="978-80-214-5614-3", url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2018_sbornik.pdf" }