Publication detail

MODEL OF THE CANTILEVER USED AS A WEAK FORCE SENSOR IN ATOMIC FORCE MICROSCOPY

HROUZEK, M.

Original Title

MODEL OF THE CANTILEVER USED AS A WEAK FORCE SENSOR IN ATOMIC FORCE MICROSCOPY

Type

conference paper

Language

English

Original Abstract

New types of weak forces measurements with Atomic Force Microscope (AFM) are very challenging for experimental physics and call for new studies on control strategies operating the AFM. It is thus necessary to firstrst develop a precise model of the cantilever with its sharp tip, in interaction with the scanned sample. This paper presents a model of the cantilever, that is based on beam theory and taking into account the influence of the long distance interaction forces. Copyright C 2005 IFAC

Key words in English

Microscopes, Microsystems, Models

Authors

HROUZEK, M.

RIV year

2005

Released

3. 7. 2005

Publisher

International Federation of Automatic Control

Location

Prague

Pages from

1

Pages to

6

Pages count

6

BibTex

@inproceedings{BUT15482,
  author="Michal {Hrouzek}",
  title="MODEL OF THE CANTILEVER USED AS A WEAK FORCE SENSOR IN ATOMIC FORCE MICROSCOPY",
  booktitle="16th IFAC World Congress",
  year="2005",
  pages="6",
  publisher="International Federation of Automatic Control",
  address="Prague"
}