Detail publikačního výsledku

MODEL OF THE CANTILEVER USED AS A WEAK FORCE SENSOR IN ATOMIC FORCE MICROSCOPY

HROUZEK, M.

Originální název

MODEL OF THE CANTILEVER USED AS A WEAK FORCE SENSOR IN ATOMIC FORCE MICROSCOPY

Anglický název

MODEL OF THE CANTILEVER USED AS A WEAK FORCE SENSOR IN ATOMIC FORCE MICROSCOPY

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

New types of weak forces measurements with Atomic Force Microscope (AFM) are very challenging for experimental physics and call for new studies on control strategies operating the AFM. It is thus necessary to firstrst develop a precise model of the cantilever with its sharp tip, in interaction with the scanned sample. This paper presents a model of the cantilever, that is based on beam theory and taking into account the influence of the long distance interaction forces. Copyright C 2005 IFAC

Anglický abstrakt

New types of weak forces measurements with Atomic Force Microscope (AFM) are very challenging for experimental physics and call for new studies on control strategies operating the AFM. It is thus necessary to firstrst develop a precise model of the cantilever with its sharp tip, in interaction with the scanned sample. This paper presents a model of the cantilever, that is based on beam theory and taking into account the influence of the long distance interaction forces. Copyright C 2005 IFAC

Klíčová slova v angličtině

Microscopes, Microsystems, Models

Autoři

HROUZEK, M.

Vydáno

03.07.2005

Nakladatel

International Federation of Automatic Control

Místo

Prague

Kniha

16th IFAC World Congress

Strany od

1

Strany počet

6

BibTex

@inproceedings{BUT15482,
  author="Michal {Hrouzek}",
  title="MODEL OF THE CANTILEVER USED AS A WEAK FORCE SENSOR IN ATOMIC FORCE MICROSCOPY",
  booktitle="16th IFAC World Congress",
  year="2005",
  pages="6",
  publisher="International Federation of Automatic Control",
  address="Prague"
}