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Publication detail
Sutorý, T., Kolka, Z.
Original Title
On-chip nonlinear capacitor characterization
Type
conference paper
Language
English
Original Abstract
The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.
Key words in English
characterization, linearization, non-linear capacitors, MOS transistors, compensation, measurement
Authors
RIV year
2005
Released
1. 1. 2005
ISBN
1581-4572
Periodical
Proceedings of the 15th International Electrotechnical and Computer Science Conference ERK 2006
State
Republic of Slovenia
Pages from
107
Pages to
110
Pages count
4
BibTex
@inproceedings{BUT15597, author="Tomáš {Sutorý} and Zdeněk {Kolka}", title="On-chip nonlinear capacitor characterization", booktitle="Proceedings of the fourteenth International Electrotechnical and Computer Science Conference ERK 2005", year="2005", journal="Proceedings of the 15th International Electrotechnical and Computer Science Conference ERK 2006", pages="4", issn="1581-4572" }