Detail publikace

On-chip nonlinear capacitor characterization

Sutorý, T., Kolka, Z.

Originální název

On-chip nonlinear capacitor characterization

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.

Klíčová slova v angličtině

characterization, linearization, non-linear capacitors, MOS transistors, compensation, measurement

Autoři

Sutorý, T., Kolka, Z.

Rok RIV

2005

Vydáno

1. 1. 2005

ISSN

1581-4572

Periodikum

Proceedings of the 15th International Electrotechnical and Computer Science Conference ERK 2006

Stát

Slovinská republika

Strany od

107

Strany do

110

Strany počet

4

BibTex

@inproceedings{BUT15597,
  author="Tomáš {Sutorý} and Zdeněk {Kolka}",
  title="On-chip nonlinear capacitor characterization",
  booktitle="Proceedings of the fourteenth International Electrotechnical and Computer Science Conference ERK 2005",
  year="2005",
  journal="Proceedings of the 15th International Electrotechnical and Computer Science Conference ERK 2006",
  pages="4",
  issn="1581-4572"
}