Publication detail

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

FIALA, P. BARTUŠEK, K. DĚDKOVÁ, J. KADLEC, R. DOHNAL, P.

Original Title

Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

Type

journal article in Web of Science

Language

English

Original Abstract

We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell's law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.

Keywords

Nanomaterials; multilayered material; resonance; periodic system; electromagnetic wave; X-ray; gamma-ray; antireflection; shielding

Authors

FIALA, P.; BARTUŠEK, K.; DĚDKOVÁ, J.; KADLEC, R.; DOHNAL, P.

Released

30. 7. 2019

Publisher

https://content.sciendo.com/configurable/contentpage/journals$002fmsr$002f19$002f4$002farticle-p144.xml

Location

WARSAW, POLAND

ISBN

1335-8871

Periodical

Measurement Science Review

Year of study

19

Number

4

State

Slovak Republic

Pages from

144

Pages to

152

Pages count

9

URL

Full text in the Digital Library

BibTex

@article{BUT161036,
  author="Pavel {Fiala} and Karel {Bartušek} and Jarmila {Dědková} and Radim {Kadlec} and Přemysl {Dohnal}",
  title="Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation",
  journal="Measurement Science Review",
  year="2019",
  volume="19",
  number="4",
  pages="144--152",
  doi="10.2478/msr-2019-0020",
  issn="1335-8871",
  url="http://www.degruyter.com/view/j/msr.2019.19.issue-4/msr-2019-0020/msr-2019-0020.xml?format=INT"
}