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Detail publikace
FIALA, P. BARTUŠEK, K. DĚDKOVÁ, J. KADLEC, R. DOHNAL, P.
Originální název
Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell's law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.
Klíčová slova
Nanomaterials; multilayered material; resonance; periodic system; electromagnetic wave; X-ray; gamma-ray; antireflection; shielding
Autoři
FIALA, P.; BARTUŠEK, K.; DĚDKOVÁ, J.; KADLEC, R.; DOHNAL, P.
Vydáno
30. 7. 2019
Nakladatel
https://content.sciendo.com/configurable/contentpage/journals$002fmsr$002f19$002f4$002farticle-p144.xml
Místo
WARSAW, POLAND
ISSN
1335-8871
Periodikum
Measurement Science Review
Ročník
19
Číslo
4
Stát
Slovenská republika
Strany od
144
Strany do
152
Strany počet
9
URL
http://www.degruyter.com/view/j/msr.2019.19.issue-4/msr-2019-0020/msr-2019-0020.xml?format=INT
Plný text v Digitální knihovně
http://hdl.handle.net/11012/200888
BibTex
@article{BUT161036, author="Pavel {Fiala} and Karel {Bartušek} and Jarmila {Dědková} and Radim {Kadlec} and Přemysl {Dohnal}", title="Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation", journal="Measurement Science Review", year="2019", volume="19", number="4", pages="144--152", doi="10.2478/msr-2019-0020", issn="1335-8871", url="http://www.degruyter.com/view/j/msr.2019.19.issue-4/msr-2019-0020/msr-2019-0020.xml?format=INT" }