Publication detail

Electrical Source Imaging in Rats: Cortical EEG Performance and Limitations

KOUDELKA, V. JIŘÍČEK, S. PIORECKÁ, V. VEJMOLA, Č. PÁLENÍČEK, T. RAIDA, Z. LAČÍK, J. KUŘÁTKO, D. WOJCIK, D.

Original Title

Electrical Source Imaging in Rats: Cortical EEG Performance and Limitations

Type

conference paper

Language

English

Original Abstract

The goal of the present work is to estimate electric activity within the brain volume based on measured potentials on the rats brain surface. At first, we calculated and analyzed sensitivity volume profile of cortical electrode pairs to address the cortical electrode positioning. Sensitivity volume profiles change rapidly with decreasing of expected minimal depth of the sources. Moreover, the profiles become unreliable in case of very small expected minimal depths, which is, unfortunately, the case of cortical electroencephalogram (EEG). This result was obtained in both analytical and numerical models. Second, appropriate regularization and normalization routines were implemented for minimum norm estimate and beam-forming methods. Third, the inverse methods were applied to localize simulated brain deep sources based on the twelve electrode cortical EEG system.

Keywords

Rat brain, potentials, cortical electrode positioning, senitivity volume profile, regularization, normalization, inverse imaging.

Authors

KOUDELKA, V.; JIŘÍČEK, S.; PIORECKÁ, V.; VEJMOLA, Č.; PÁLENÍČEK, T.; RAIDA, Z.; LAČÍK, J.; KUŘÁTKO, D.; WOJCIK, D.

Released

21. 11. 2018

Publisher

IEEE

Location

NEW YORK

ISBN

978-1-5386-7845-9

Book

2018 INTERNATIONAL WORKSHOP ON COMPUTING, ELECTROMAGNETICS, AND MACHINE INTELLIGENCE (CEMI)

Pages from

45

Pages to

46

Pages count

2

BibTex

@inproceedings{BUT163516,
  author="Vlastimil {Koudelka} and Stanislav {Jiříček} and Václava {Piorecká} and Čestmír {Vejmola} and Tomáš {Páleníček} and Zbyněk {Raida} and Jaroslav {Lačík} and David {Kuřátko} and Daniel {Wojcik}",
  title="Electrical Source Imaging in Rats: Cortical EEG Performance and Limitations",
  booktitle="2018 INTERNATIONAL WORKSHOP ON COMPUTING, ELECTROMAGNETICS, AND MACHINE INTELLIGENCE (CEMI)",
  year="2018",
  pages="45--46",
  publisher="IEEE",
  address="NEW YORK",
  doi="10.1109/CEMI.2018.8610587",
  isbn="978-1-5386-7845-9"
}