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KOUDELKA, V. JIŘÍČEK, S. PIORECKÁ, V. VEJMOLA, Č. PÁLENÍČEK, T. RAIDA, Z. LAČÍK, J. KUŘÁTKO, D. WOJCIK, D.
Original Title
Electrical Source Imaging in Rats: Cortical EEG Performance and Limitations
Type
conference paper
Language
English
Original Abstract
The goal of the present work is to estimate electric activity within the brain volume based on measured potentials on the rats brain surface. At first, we calculated and analyzed sensitivity volume profile of cortical electrode pairs to address the cortical electrode positioning. Sensitivity volume profiles change rapidly with decreasing of expected minimal depth of the sources. Moreover, the profiles become unreliable in case of very small expected minimal depths, which is, unfortunately, the case of cortical electroencephalogram (EEG). This result was obtained in both analytical and numerical models. Second, appropriate regularization and normalization routines were implemented for minimum norm estimate and beam-forming methods. Third, the inverse methods were applied to localize simulated brain deep sources based on the twelve electrode cortical EEG system.
Keywords
Rat brain, potentials, cortical electrode positioning, senitivity volume profile, regularization, normalization, inverse imaging.
Authors
KOUDELKA, V.; JIŘÍČEK, S.; PIORECKÁ, V.; VEJMOLA, Č.; PÁLENÍČEK, T.; RAIDA, Z.; LAČÍK, J.; KUŘÁTKO, D.; WOJCIK, D.
Released
21. 11. 2018
Publisher
IEEE
Location
NEW YORK
ISBN
978-1-5386-7845-9
Book
2018 INTERNATIONAL WORKSHOP ON COMPUTING, ELECTROMAGNETICS, AND MACHINE INTELLIGENCE (CEMI)
Pages from
45
Pages to
46
Pages count
2
BibTex
@inproceedings{BUT163516, author="Vlastimil {Koudelka} and Stanislav {Jiříček} and Václava {Piorecká} and Čestmír {Vejmola} and Tomáš {Páleníček} and Zbyněk {Raida} and Jaroslav {Lačík} and David {Kuřátko} and Daniel {Wojcik}", title="Electrical Source Imaging in Rats: Cortical EEG Performance and Limitations", booktitle="2018 INTERNATIONAL WORKSHOP ON COMPUTING, ELECTROMAGNETICS, AND MACHINE INTELLIGENCE (CEMI)", year="2018", pages="45--46", publisher="IEEE", address="NEW YORK", doi="10.1109/CEMI.2018.8610587", isbn="978-1-5386-7845-9" }