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KOUDELKA, V. JIŘÍČEK, S. PIORECKÁ, V. VEJMOLA, Č. PÁLENÍČEK, T. RAIDA, Z. LAČÍK, J. KUŘÁTKO, D. WOJCIK, D.
Originální název
Electrical Source Imaging in Rats: Cortical EEG Performance and Limitations
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The goal of the present work is to estimate electric activity within the brain volume based on measured potentials on the rats brain surface. At first, we calculated and analyzed sensitivity volume profile of cortical electrode pairs to address the cortical electrode positioning. Sensitivity volume profiles change rapidly with decreasing of expected minimal depth of the sources. Moreover, the profiles become unreliable in case of very small expected minimal depths, which is, unfortunately, the case of cortical electroencephalogram (EEG). This result was obtained in both analytical and numerical models. Second, appropriate regularization and normalization routines were implemented for minimum norm estimate and beam-forming methods. Third, the inverse methods were applied to localize simulated brain deep sources based on the twelve electrode cortical EEG system.
Klíčová slova
Rat brain, potentials, cortical electrode positioning, senitivity volume profile, regularization, normalization, inverse imaging.
Autoři
KOUDELKA, V.; JIŘÍČEK, S.; PIORECKÁ, V.; VEJMOLA, Č.; PÁLENÍČEK, T.; RAIDA, Z.; LAČÍK, J.; KUŘÁTKO, D.; WOJCIK, D.
Vydáno
21. 11. 2018
Nakladatel
IEEE
Místo
NEW YORK
ISBN
978-1-5386-7845-9
Kniha
2018 INTERNATIONAL WORKSHOP ON COMPUTING, ELECTROMAGNETICS, AND MACHINE INTELLIGENCE (CEMI)
Strany od
45
Strany do
46
Strany počet
2
BibTex
@inproceedings{BUT163516, author="Vlastimil {Koudelka} and Stanislav {Jiříček} and Václava {Piorecká} and Čestmír {Vejmola} and Tomáš {Páleníček} and Zbyněk {Raida} and Jaroslav {Lačík} and David {Kuřátko} and Daniel {Wojcik}", title="Electrical Source Imaging in Rats: Cortical EEG Performance and Limitations", booktitle="2018 INTERNATIONAL WORKSHOP ON COMPUTING, ELECTROMAGNETICS, AND MACHINE INTELLIGENCE (CEMI)", year="2018", pages="45--46", publisher="IEEE", address="NEW YORK", doi="10.1109/CEMI.2018.8610587", isbn="978-1-5386-7845-9" }