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STÖGER-POLLACH, M. LÖFFLER, S. MAURER, N. BUKVIŠOVÁ, K.
Original Title
Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence
Type
journal article in Web of Science
Language
English
Original Abstract
Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Perot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).
Keywords
Cerenkov; Radiation; Cathodoluminescence; VEELS
Authors
STÖGER-POLLACH, M.; LÖFFLER, S.; MAURER, N.; BUKVIŠOVÁ, K.
Released
1. 7. 2020
Publisher
Elsevier
Location
AMSTERDAM
ISBN
0304-3991
Periodical
Ultramicroscopy
Year of study
214
Number
1
State
Kingdom of the Netherlands
Pages from
Pages to
5
Pages count
URL
https://www.sciencedirect.com/science/article/pii/S0304399120300073
Full text in the Digital Library
http://hdl.handle.net/11012/195860
BibTex
@article{BUT165496, author="Michael {Stöger-Pollach} and Stefan {Löffler} and Niklas {Maurer} and Kristýna {Bukvišová}", title="Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence", journal="Ultramicroscopy", year="2020", volume="214", number="1", pages="1--5", doi="10.1016/j.ultramic.2020.113011", issn="0304-3991", url="https://www.sciencedirect.com/science/article/pii/S0304399120300073" }