Publication detail

Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence

STÖGER-POLLACH, M. LÖFFLER, S. MAURER, N. BUKVIŠOVÁ, K.

Original Title

Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence

Type

journal article in Web of Science

Language

English

Original Abstract

Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Perot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).

Keywords

Cerenkov; Radiation; Cathodoluminescence; VEELS

Authors

STÖGER-POLLACH, M.; LÖFFLER, S.; MAURER, N.; BUKVIŠOVÁ, K.

Released

1. 7. 2020

Publisher

Elsevier

Location

AMSTERDAM

ISBN

0304-3991

Periodical

Ultramicroscopy

Year of study

214

Number

1

State

Kingdom of the Netherlands

Pages from

1

Pages to

5

Pages count

5

URL

Full text in the Digital Library

BibTex

@article{BUT165496,
  author="Michael {Stöger-Pollach} and Stefan {Löffler} and Niklas {Maurer} and Kristýna {Bukvišová}",
  title="Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence",
  journal="Ultramicroscopy",
  year="2020",
  volume="214",
  number="1",
  pages="1--5",
  doi="10.1016/j.ultramic.2020.113011",
  issn="0304-3991",
  url="https://www.sciencedirect.com/science/article/pii/S0304399120300073"
}