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Detail publikace
STÖGER-POLLACH, M. LÖFFLER, S. MAURER, N. BUKVIŠOVÁ, K.
Originální název
Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Perot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).
Klíčová slova
Cerenkov; Radiation; Cathodoluminescence; VEELS
Autoři
STÖGER-POLLACH, M.; LÖFFLER, S.; MAURER, N.; BUKVIŠOVÁ, K.
Vydáno
1. 7. 2020
Nakladatel
Elsevier
Místo
AMSTERDAM
ISSN
0304-3991
Periodikum
Ultramicroscopy
Ročník
214
Číslo
1
Stát
Nizozemsko
Strany od
Strany do
5
Strany počet
URL
https://www.sciencedirect.com/science/article/pii/S0304399120300073
Plný text v Digitální knihovně
http://hdl.handle.net/11012/195860
BibTex
@article{BUT165496, author="Michael {Stöger-Pollach} and Stefan {Löffler} and Niklas {Maurer} and Kristýna {Bukvišová}", title="Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence", journal="Ultramicroscopy", year="2020", volume="214", number="1", pages="1--5", doi="10.1016/j.ultramic.2020.113011", issn="0304-3991", url="https://www.sciencedirect.com/science/article/pii/S0304399120300073" }