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MATERNA MIKMEKOVÁ, E. MÜLLEROVÁ, I. FRANK, L. POLČÁK, J. SLUYTERMAN, S. LEJEUNE, M. KONVALINA, I.
Original Title
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer
Type
journal article in Web of Science
Language
English
Original Abstract
Two-dimensional materials, such as graphene, are usually prepared by chemical vapor deposition (CVD) on selected substrates, and their transfer is completed with a supporting layer, mostly polymethyl methacrylate (PMMA). Indeed, the PMMA has to be removed precisely to obtain the predicted superior properties of graphene after the transfer process. We demonstrate a new and effective technique to achieve a polymer-free CVD graphene - by utilizing low-energy electron irradiation in a scanning low-energy electron microscope (SLEEM). The influence of electron-landing energy on cleaning efficiency and graphene quality was observed by SLEEM, Raman spectroscopy (the presence of disorder D peak) and XPS (the deconvolution of the C 1s peak). After removing the absorbed molecules and polymer residues from the graphene surface with slow electrons, the individual graphene layers can also be distinguished outside ultra-high vacuum conditions in both the reflected and transmitted modes of a scanning low-energy (transmission) electron microscope.
Keywords
Graphene; PMMA; Slow electron treatment; XPS; Raman spectroscopy
Authors
MATERNA MIKMEKOVÁ, E.; MÜLLEROVÁ, I.; FRANK, L.; POLČÁK, J.; SLUYTERMAN, S.; LEJEUNE, M.; KONVALINA, I.
Released
1. 5. 2020
Publisher
Elsevier
Location
AMSTERDAM
ISBN
0368-2048
Periodical
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Year of study
241
Number
1
State
Kingdom of the Netherlands
Pages from
Pages to
7
Pages count
URL
https://www.sciencedirect.com/science/article/pii/S0368204818302068
Full text in the Digital Library
http://hdl.handle.net/11012/195816
BibTex
@article{BUT167372, author="Eliška {Materna Mikmeková} and Ilona {Müllerová} and Luděk {Frank} and Josef {Polčák} and Seyno {Sluyterman} and Michaël {Lejeune} and Ivo {Konvalina}", title="Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer", journal="JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA", year="2020", volume="241", number="1", pages="1--7", doi="10.1016/j.elspec.2019.06.005", issn="0368-2048", url="https://www.sciencedirect.com/science/article/pii/S0368204818302068" }
Documents
1-s2.0-S0368204818302068-main.pdf