Detail publikace
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer
MATERNA MIKMEKOVÁ, E. MÜLLEROVÁ, I. FRANK, L. POLČÁK, J. SLUYTERMAN, S. LEJEUNE, M. KONVALINA, I.
Originální název
Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
Two-dimensional materials, such as graphene, are usually prepared by chemical vapor deposition (CVD) on selected substrates, and their transfer is completed with a supporting layer, mostly polymethyl methacrylate (PMMA). Indeed, the PMMA has to be removed precisely to obtain the predicted superior properties of graphene after the transfer process. We demonstrate a new and effective technique to achieve a polymer-free CVD graphene - by utilizing low-energy electron irradiation in a scanning low-energy electron microscope (SLEEM). The influence of electron-landing energy on cleaning efficiency and graphene quality was observed by SLEEM, Raman spectroscopy (the presence of disorder D peak) and XPS (the deconvolution of the C 1s peak). After removing the absorbed molecules and polymer residues from the graphene surface with slow electrons, the individual graphene layers can also be distinguished outside ultra-high vacuum conditions in both the reflected and transmitted modes of a scanning low-energy (transmission) electron microscope.
Klíčová slova
Graphene; PMMA; Slow electron treatment; XPS; Raman spectroscopy
Autoři
MATERNA MIKMEKOVÁ, E.; MÜLLEROVÁ, I.; FRANK, L.; POLČÁK, J.; SLUYTERMAN, S.; LEJEUNE, M.; KONVALINA, I.
Vydáno
1. 5. 2020
Nakladatel
Elsevier
Místo
AMSTERDAM
ISSN
0368-2048
Periodikum
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Ročník
241
Číslo
1
Stát
Nizozemsko
Strany od
1
Strany do
7
Strany počet
7
URL
Plný text v Digitální knihovně
BibTex
@article{BUT167372,
author="Eliška {Materna Mikmeková} and Ilona {Müllerová} and Luděk {Frank} and Josef {Polčák} and Seyno {Sluyterman} and Michaël {Lejeune} and Ivo {Konvalina}",
title="Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer",
journal="JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA",
year="2020",
volume="241",
number="1",
pages="1--7",
doi="10.1016/j.elspec.2019.06.005",
issn="0368-2048",
url="https://www.sciencedirect.com/science/article/pii/S0368204818302068"
}
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