Publication detail

Survey and Benchmarking of Methods for Formal Analysis of Approximate Circuits

VAŠÍČEK, Z.

Original Title

Survey and Benchmarking of Methods for Formal Analysis of Approximate Circuits

Type

journal article - other

Language

English

Authors

VAŠÍČEK, Z.

Released

31. 3. 2019

ISBN

0026-2714

Periodical

Microelectronics Reliability

Year of study

2019

Number

99

State

United Kingdom of Great Britain and Northern Ireland

Pages from

1

Pages to

36

Pages count

35

BibTex

@article{BUT168515,
  author="Zdeněk {Vašíček}",
  title="Survey and Benchmarking of Methods for Formal Analysis of Approximate Circuits",
  journal="Microelectronics Reliability",
  year="2019",
  volume="2019",
  number="99",
  pages="1--36",
  issn="0026-2714"
}