Publication detail

Coherent x-ray scattering in an XPEEM setup

Mentes, TO. Genuzio, F. Schanilec, V. Sadilek, J. Rougemaille, N. Locatelli, A.

Original Title

Coherent x-ray scattering in an XPEEM setup

Type

journal article in Web of Science

Language

English

Original Abstract

X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast.

Keywords

XPEEM; Speckle; CDI; Reconstruction; Resonant x-ray scattering; LEEM

Authors

Mentes, TO.; Genuzio, F.; Schanilec, V.; Sadilek, J.; Rougemaille, N.; Locatelli, A.

Released

1. 9. 2020

Publisher

ELSEVIER

Location

AMSTERDAM

ISBN

0304-3991

Periodical

Ultramicroscopy

Year of study

216

Number

1

State

Kingdom of the Netherlands

Pages from

113035-1

Pages to

113035-8

Pages count

8

URL