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Mentes, TO. Genuzio, F. Schanilec, V. Sadilek, J. Rougemaille, N. Locatelli, A.
Original Title
Coherent x-ray scattering in an XPEEM setup
Type
journal article in Web of Science
Language
English
Original Abstract
X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast.
Keywords
XPEEM; Speckle; CDI; Reconstruction; Resonant x-ray scattering; LEEM
Authors
Mentes, TO.; Genuzio, F.; Schanilec, V.; Sadilek, J.; Rougemaille, N.; Locatelli, A.
Released
1. 9. 2020
Publisher
ELSEVIER
Location
AMSTERDAM
ISBN
0304-3991
Periodical
Ultramicroscopy
Year of study
216
Number
1
State
Kingdom of the Netherlands
Pages from
113035-1
Pages to
113035-8
Pages count
8
URL
https://www.sciencedirect.com/science/article/pii/S0304399120300759?via%3Dihub