Detail publikace

Coherent x-ray scattering in an XPEEM setup

Mentes, TO. Genuzio, F. Schanilec, V. Sadilek, J. Rougemaille, N. Locatelli, A.

Originální název

Coherent x-ray scattering in an XPEEM setup

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast.

Klíčová slova

XPEEM; Speckle; CDI; Reconstruction; Resonant x-ray scattering; LEEM

Autoři

Mentes, TO.; Genuzio, F.; Schanilec, V.; Sadilek, J.; Rougemaille, N.; Locatelli, A.

Vydáno

1. 9. 2020

Nakladatel

ELSEVIER

Místo

AMSTERDAM

ISSN

0304-3991

Periodikum

Ultramicroscopy

Ročník

216

Číslo

1

Stát

Nizozemsko

Strany od

113035-1

Strany do

113035-8

Strany počet

8

URL