Publication detail

Landau level spectroscopy of Bi2Te3

Mohelský, I. Dubroka, A. Wyzula, J. Slobodeniuk, A. Martinez, G. Krupko, Y. Piot, B. A. Caha, O. Humlíček, J. Bauer, G. Springholz, G. Orlita, M.

Original Title

Landau level spectroscopy of Bi2Te3

Type

journal article in Web of Science

Language

English

Original Abstract

Here we report on Landau level spectroscopy in magnetic fields up to 34 T performed on a thin film of the topological insulator Bi2Te3 epitaxially grown on a BaF2 substrate. The observed response is consistent with the picture of a direct-gap semiconductor in which charge carriers closely resemble massive Dirac particles. The fundamental band gap reaches E-g = (175 +/- 5) meV at low temperatures and it is not located on the trigonal axis, thus displaying either sixfold or twelvefold valley degeneracy. Interestingly, our magneto-optical data do not indicate any band inversion at the direct gap. This suggests that the fundamental band gap is relatively distant from the Gamma point where profound inversion exists and gives rise to the relativisticlike surface states of Bi2Te3.

Keywords

BISMUTH TELLURIDE; TOPOLOGICAL INSULATORS; THERMOELECTRIC PROPERTIES; CONDUCTION ELECTRONS; OPTICAL-PROPERTIES; VALENCE-BAND; BI2SE3; SB2TE3; ABSORPTION; RESONANCE

Authors

Mohelský, I.; Dubroka, A.; Wyzula, J.; Slobodeniuk, A.; Martinez, G.; Krupko, Y.; Piot, B. A.; Caha, O.; Humlíček, J.; Bauer, G.; Springholz, G.; Orlita, M.

Released

7. 8. 2020

Publisher

AMER PHYSICAL SOC

Location

COLLEGE PK

ISBN

1095-3795

Periodical

Physical Review B

Year of study

102

Number

8

State

United States of America

Pages from

085201-1

Pages to

085201-11

Pages count

11

URL