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ŘIHÁČEK, T. HORÁK, M. SCHACHINGER, T. MIKA, F. MATĚJKA, M. KRÁTKÝ, S. FOŘT, T. RADLIČKA, T. JOHNSON, C. NOVÁK, L. SEĎA, B. MCMORRAN, B. MÜLLEROVÁ, I.
Original Title
Beam shaping and probe characterization in the scanning electron microscope
Type
journal article in Web of Science
Language
English
Original Abstract
Here we demonstrate the use of nanofabricated grating holograms to diffract and shape electrons in a scanning electron microscope. The diffraction grating is placed in an aperture in the column. The entire diffraction pattern can be passed through the objective lens and projected onto the specimen, or an intermediate aperture can be used to select particular diffracted beams. We discuss several techniques for characterizing the diffraction pattern. The grating designs can incorporate features that can influence the phase and intensity of the diffracted SEM probe. We demonstrate this by producing electron vortex beams.
Keywords
Electron diffraction;SEM;Electron beam structuring;Spot shape measurement;Electron vortex beam
Authors
ŘIHÁČEK, T.; HORÁK, M.; SCHACHINGER, T.; MIKA, F.; MATĚJKA, M.; KRÁTKÝ, S.; FOŘT, T.; RADLIČKA, T.; JOHNSON, C.; NOVÁK, L.; SEĎA, B.; MCMORRAN, B.; MÜLLEROVÁ, I.
Released
21. 4. 2021
Publisher
Elsevier
ISBN
0304-3991
Periodical
Ultramicroscopy
Year of study
225
Number
1
State
Kingdom of the Netherlands
Pages from
Pages to
9
Pages count
URL
https://doi.org/10.1016/j.ultramic.2021.113268
BibTex
@article{BUT171291, author="Tomáš {Řiháček} and Michal {Horák} and Thomas {Schachinger} and Filip {Mika} and Milan {Matějka} and S. {Krátký} and Tomáš {Fořt} and Tomáš {Radlička} and C.W. {Johnson} and Libor {Novák} and Bohuslav {Seďa} and B.J. {McMorran} and Ilona {Müllerová}", title="Beam shaping and probe characterization in the scanning electron microscope", journal="Ultramicroscopy", year="2021", volume="225", number="1", pages="1--9", doi="10.1016/j.ultramic.2021.113268", issn="0304-3991", url="https://doi.org/10.1016/j.ultramic.2021.113268" }