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Hertl, I., Vavrda M
Original Title
Near-field to far-field pattern transformation process improvement and near-field measuring site outline
Type
conference paper
Language
English
Original Abstract
The possibility of using standard statistic methods for improving the process of evaluation of the far-field pattern from near-field planar measurement is presented in the paper. Three basic situations of inaccuracy distribution (random, single systematic and multiple systematic) are discussed. The basic demands on measuring site and ways to achieve them are outlined.
Key words in English
near-field, far-field, pattern measurement
Authors
RIV year
2005
Released
1. 1. 2005
Publisher
University of Miskolc
Location
Miskolc
Pages from
1
Pages to
4
Pages count
BibTex
@inproceedings{BUT17322, author="Ivo {Hertl} and Michal {Vavrda}", title="Near-field to far-field pattern transformation process improvement and near-field measuring site outline", booktitle="Proceedings of Miskolc", year="2005", pages="4", publisher="University of Miskolc", address="Miskolc" }