Publication detail

Near-field to far-field pattern transformation process improvement and near-field measuring site outline

Hertl, I., Vavrda M

Original Title

Near-field to far-field pattern transformation process improvement and near-field measuring site outline

Type

conference paper

Language

English

Original Abstract

The possibility of using standard statistic methods for improving the process of evaluation of the far-field pattern from near-field planar measurement is presented in the paper. Three basic situations of inaccuracy distribution (random, single systematic and multiple systematic) are discussed. The basic demands on measuring site and ways to achieve them are outlined.

Key words in English

near-field, far-field, pattern measurement

Authors

Hertl, I., Vavrda M

RIV year

2005

Released

1. 1. 2005

Publisher

University of Miskolc

Location

Miskolc

Pages from

1

Pages to

4

Pages count

4

BibTex

@inproceedings{BUT17322,
  author="Ivo {Hertl} and Michal {Vavrda}",
  title="Near-field to far-field pattern transformation process improvement and near-field measuring site outline",
  booktitle="Proceedings of Miskolc",
  year="2005",
  pages="4",
  publisher="University of Miskolc",
  address="Miskolc"
}