Detail publikace

Near-field to far-field pattern transformation process improvement and near-field measuring site outline

Hertl, I., Vavrda M

Originální název

Near-field to far-field pattern transformation process improvement and near-field measuring site outline

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The possibility of using standard statistic methods for improving the process of evaluation of the far-field pattern from near-field planar measurement is presented in the paper. Three basic situations of inaccuracy distribution (random, single systematic and multiple systematic) are discussed. The basic demands on measuring site and ways to achieve them are outlined.

Klíčová slova v angličtině

near-field, far-field, pattern measurement

Autoři

Hertl, I., Vavrda M

Rok RIV

2005

Vydáno

1. 1. 2005

Nakladatel

University of Miskolc

Místo

Miskolc

Strany od

1

Strany do

4

Strany počet

4

BibTex

@inproceedings{BUT17322,
  author="Ivo {Hertl} and Michal {Vavrda}",
  title="Near-field to far-field pattern transformation process improvement and near-field measuring site outline",
  booktitle="Proceedings of Miskolc",
  year="2005",
  pages="4",
  publisher="University of Miskolc",
  address="Miskolc"
}