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Detail publikace
Hertl, I., Vavrda M
Originální název
Near-field to far-field pattern transformation process improvement and near-field measuring site outline
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The possibility of using standard statistic methods for improving the process of evaluation of the far-field pattern from near-field planar measurement is presented in the paper. Three basic situations of inaccuracy distribution (random, single systematic and multiple systematic) are discussed. The basic demands on measuring site and ways to achieve them are outlined.
Klíčová slova v angličtině
near-field, far-field, pattern measurement
Autoři
Rok RIV
2005
Vydáno
1. 1. 2005
Nakladatel
University of Miskolc
Místo
Miskolc
Strany od
1
Strany do
4
Strany počet
BibTex
@inproceedings{BUT17322, author="Ivo {Hertl} and Michal {Vavrda}", title="Near-field to far-field pattern transformation process improvement and near-field measuring site outline", booktitle="Proceedings of Miskolc", year="2005", pages="4", publisher="University of Miskolc", address="Miskolc" }