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Publication detail
KOTÁSEK, Z.
Original Title
Survey of Partial Scan Methodologies
Type
conference paper
Language
English
Original Abstract
Partial scan methodologies are seen as an alternative to applying a test to a digital circuit. In the presentation a survey of the methodologies is given.
Keywords
digital circuit testability, test application
Authors
Released
18. 4. 2004
Publisher
Slovak Academy of Science
Location
Bratislava
Pages from
1
Pages to
77
Pages count
BibTex
@inproceedings{BUT17574, author="Zdeněk {Kotásek}", title="Survey of Partial Scan Methodologies", booktitle="Research and Training Action for System on Chip Design, 5th FP Project", year="2004", pages="77", publisher="Slovak Academy of Science", address="Bratislava" }