Publication detail

Survey of Partial Scan Methodologies

KOTÁSEK, Z.

Original Title

Survey of Partial Scan Methodologies

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

Partial scan methodologies are seen as an alternative to applying a test to a digital circuit. In the presentation a survey of the methodologies is given.

Keywords

digital circuit testability, test application

Authors

KOTÁSEK, Z.

Released

18. 4. 2004

Publisher

Slovak Academy of Science

Location

Bratislava

Pages from

1

Pages to

77

Pages count

77

BibTex

@inproceedings{BUT17574,
  author="Zdeněk {Kotásek}",
  title="Survey of Partial Scan Methodologies",
  booktitle="Research and Training Action for System on Chip Design, 5th FP Project",
  year="2004",
  pages="1--77",
  publisher="Slovak Academy of Science",
  address="Bratislava"
}