Publication detail

A Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurement

MIKLÁŠ, J. PROCHÁZKA, P.

Original Title

A Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurement

Type

conference paper

Language

English

Original Abstract

This paper proposes a simple and accessible method for dynamic calorimetric measurement of ultra-fast power semiconductor devices switching loss. It utilizes a temperature rise monitoring of a copper cube thermally coupled with a semiconductor chip. No special chambers or heat exchangers are used and no additional wiring compared to standard electric pulsed test. This provides an opportunity to perform a direct comparison with traditional electric power loss measurement, including all of the parasitic influences and further investigation of power loss with intentional varying of particular elements impact, which absent in available literature. The paper establishes the test method and setup as well a basic comparison of calorimetric and electric measurement.

Keywords

Power Semiconductor SiC MOSFET Switching Loss, Parasitic Waveform Distortion, Calorimetric Power Loss Measurement, Electrical Measurement, Double Pulse Test, Measurement Methods Comparison

Authors

MIKLÁŠ, J.; PROCHÁZKA, P.

Released

26. 4. 2022

Publisher

Brno University of Technology, Faculty of Electrical Engineering and Technology

Location

Brno

ISBN

978-80-214-6030-0

Book

PROCEEDINGS II OF THE 28TH STUDENT EEICT 2022 Selected Papers

Edition

1

Pages from

198

Pages to

203

Pages count

6

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_2_v3.pdf

BibTex

@inproceedings{BUT180260,
  author="Ján {Mikláš} and Petr {Procházka}",
  title="A Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurement",
  booktitle="PROCEEDINGS II OF THE 28TH STUDENT EEICT 2022 Selected Papers",
  year="2022",
  series="1",
  pages="198--203",
  publisher="Brno University of Technology, Faculty of Electrical Engineering and Technology",
  address="Brno",
  isbn="978-80-214-6030-0",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_2_v3.pdf"
}