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MIKLÁŠ, J. PROCHÁZKA, P.
Originální název
A Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurement
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This paper proposes a simple and accessible method for dynamic calorimetric measurement of ultra-fast power semiconductor devices switching loss. It utilizes a temperature rise monitoring of a copper cube thermally coupled with a semiconductor chip. No special chambers or heat exchangers are used and no additional wiring compared to standard electric pulsed test. This provides an opportunity to perform a direct comparison with traditional electric power loss measurement, including all of the parasitic influences and further investigation of power loss with intentional varying of particular elements impact, which absent in available literature. The paper establishes the test method and setup as well a basic comparison of calorimetric and electric measurement.
Klíčová slova
Power Semiconductor SiC MOSFET Switching Loss, Parasitic Waveform Distortion, Calorimetric Power Loss Measurement, Electrical Measurement, Double Pulse Test, Measurement Methods Comparison
Autoři
MIKLÁŠ, J.; PROCHÁZKA, P.
Vydáno
26. 4. 2022
Nakladatel
Brno University of Technology, Faculty of Electrical Engineering and Technology
Místo
Brno
ISBN
978-80-214-6030-0
Kniha
PROCEEDINGS II OF THE 28TH STUDENT EEICT 2022 Selected Papers
Edice
1
Strany od
198
Strany do
203
Strany počet
6
URL
https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_2_v3.pdf
BibTex
@inproceedings{BUT180260, author="Ján {Mikláš} and Petr {Procházka}", title="A Simple Calorimetric Measurement of SiC MOSFET Switching Loss and Comparison with Electric Measurement", booktitle="PROCEEDINGS II OF THE 28TH STUDENT EEICT 2022 Selected Papers", year="2022", series="1", pages="198--203", publisher="Brno University of Technology, Faculty of Electrical Engineering and Technology", address="Brno", isbn="978-80-214-6030-0", url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_2_v3.pdf" }