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Publication detail
Slang, S. Gu, B. Zhang, B. Janicek, P. Rodriguez-Pereira, J. Wagner, T.
Original Title
Direct visualization and 3D reconstruction of conductive filaments in aSiO2 material-based memristive device
Type
journal article in Web of Science
Language
English
Original Abstract
Observation of conductive filaments has greatly aided the development of theoretical models of memristive devices. In this work, we visualized and reconstructed the conductive filaments in a Cu/Cu-doped SiO2/W device employing a focused ion beam (FIB) as a milling technique. The SEM images taken from the device after 150 DC sweep cycles showed that Joule heat played a vital role in determining the morphology of a conductive filament, where the vaporization of the conductive filament resulted in the creation of defects, including particles, voids, and cavities. The competition between the formation and vaporization of conductive filaments generally induces a remarkable current fluctuation. Since Cu-doped SiO2 was utilized as the electrolyte, the vapors exfoliated adjacent single layers. FIB milling proceeded in top-down and front-back modes; thus, a 3D model of conductive filaments and defects was constructed according to a series of FIB-SEM images. This methodology is promising for a future failure analysis of memristive devices.
Keywords
PERFORMANCE
Authors
Slang, S.; Gu, B.; Zhang, B.; Janicek, P.; Rodriguez-Pereira, J.; Wagner, T.
Released
27. 3. 2024
Publisher
ROYAL SOC CHEMISTRY
Location
CAMBRIDGE
ISBN
1463-9084
Periodical
Physical Chemistry Chemical Physics
Year of study
26
Number
13
State
United Kingdom of Great Britain and Northern Ireland
Pages from
10069
Pages to
10077
Pages count
9
URL
https://pubs.rsc.org/en/content/articlelanding/2024/cp/d4cp00274a
BibTex
@article{BUT188828, author="Slang, S. and Gu, B. and Zhang, B. and Janicek, P. and Rodriguez-Pereira, J. and Wagner, T.", title="Direct visualization and 3D reconstruction of conductive filaments in aSiO2 material-based memristive device", journal="Physical Chemistry Chemical Physics", year="2024", volume="26", number="13", pages="10069--10077", doi="10.1039/d4cp00274a", issn="1463-9084", url="https://pubs.rsc.org/en/content/articlelanding/2024/cp/d4cp00274a" }