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KOTÁSEK, Z. STRNADEL, J.
Original Title
SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System
Type
conference paper
Language
English
Original Abstract
In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.
Keywords
scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain
Authors
KOTÁSEK, Z.; STRNADEL, J.
RIV year
2006
Released
31. 3. 2006
Publisher
IEEE Computer Society
Location
Los Alamitos, CA
ISBN
0-7695-2546-6
Book
Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)
Pages from
497
Pages to
498
Pages count
2
BibTex
@inproceedings{BUT22181, author="Zdeněk {Kotásek} and Josef {Strnadel}", title="SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System", booktitle="Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)", year="2006", pages="497--498", publisher="IEEE Computer Society", address="Los Alamitos, CA", isbn="0-7695-2546-6" }