Detail publikačního výsledku

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

KOTÁSEK, Z.; STRNADEL, J.

Originální název

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

Anglický název

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

Druh

Stať ve sborníku mimo WoS a Scopus

Originální abstrakt

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.

Anglický abstrakt

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.

Klíčová slova

scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain

Klíčová slova v angličtině

scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain

Autoři

KOTÁSEK, Z.; STRNADEL, J.

Vydáno

31.03.2006

Nakladatel

IEEE Computer Society

Místo

Los Alamitos, CA

ISBN

0-7695-2546-6

Kniha

Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)

Strany od

497

Strany do

498

Strany počet

2

BibTex

@inproceedings{BUT22181,
  author="Zdeněk {Kotásek} and Josef {Strnadel}",
  title="SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System",
  booktitle="Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)",
  year="2006",
  pages="497--498",
  publisher="IEEE Computer Society",
  address="Los Alamitos, CA",
  isbn="0-7695-2546-6"
}