Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
KOTÁSEK, Z. STRNADEL, J.
Originální název
SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.
Klíčová slova
scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain
Autoři
KOTÁSEK, Z.; STRNADEL, J.
Rok RIV
2006
Vydáno
31. 3. 2006
Nakladatel
IEEE Computer Society
Místo
Los Alamitos, CA
ISBN
0-7695-2546-6
Kniha
Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)
Strany od
497
Strany do
498
Strany počet
2
BibTex
@inproceedings{BUT22181, author="Zdeněk {Kotásek} and Josef {Strnadel}", title="SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System", booktitle="Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)", year="2006", pages="497--498", publisher="IEEE Computer Society", address="Los Alamitos, CA", isbn="0-7695-2546-6" }