Publication detail

Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space

STRNADEL, J.

Original Title

Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space

Type

conference paper

Language

English

Original Abstract

In the paper, novel sessionless approach to test-schedulling is presented. It utilizes so-called STEPs during special random-search based scheduling algorithm. The algorithm explores the state-space of so-called i-schedules whereas an i-schedule is an integer-vector encoded test-schedule represented by n-touple of STEPs. Proposed algorithm tries to link tests to STEPs in such a way there are no resource sharing conflicts in the best-found test schedule and hopefully, test schedule constraints are met maximally at minimal time and TAM values.

Keywords

test scheduling, power constraint, test access mechanism, sessionless, test application graph

Authors

STRNADEL, J.

RIV year

2006

Released

20. 4. 2006

Publisher

Czech Technical University Publishing House

Location

Prague

ISBN

1-4244-0184-4

Book

Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

Pages from

161

Pages to

162

Pages count

2

BibTex

@inproceedings{BUT22186,
  author="Josef {Strnadel}",
  title="Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space",
  booktitle="Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems",
  year="2006",
  pages="161--162",
  publisher="Czech Technical University Publishing House",
  address="Prague",
  isbn="1-4244-0184-4"
}