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Publication detail
STRNADEL, J.
Original Title
Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space
Type
conference paper
Language
English
Original Abstract
In the paper, novel sessionless approach to test-schedulling is presented. It utilizes so-called STEPs during special random-search based scheduling algorithm. The algorithm explores the state-space of so-called i-schedules whereas an i-schedule is an integer-vector encoded test-schedule represented by n-touple of STEPs. Proposed algorithm tries to link tests to STEPs in such a way there are no resource sharing conflicts in the best-found test schedule and hopefully, test schedule constraints are met maximally at minimal time and TAM values.
Keywords
test scheduling, power constraint, test access mechanism, sessionless, test application graph
Authors
RIV year
2006
Released
20. 4. 2006
Publisher
Czech Technical University Publishing House
Location
Prague
ISBN
1-4244-0184-4
Book
Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
Pages from
161
Pages to
162
Pages count
2
BibTex
@inproceedings{BUT22186, author="Josef {Strnadel}", title="Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space", booktitle="Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems", year="2006", pages="161--162", publisher="Czech Technical University Publishing House", address="Prague", isbn="1-4244-0184-4" }