Detail publikace

Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space

STRNADEL, J.

Originální název

Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In the paper, novel sessionless approach to test-schedulling is presented. It utilizes so-called STEPs during special random-search based scheduling algorithm. The algorithm explores the state-space of so-called i-schedules whereas an i-schedule is an integer-vector encoded test-schedule represented by n-touple of STEPs. Proposed algorithm tries to link tests to STEPs in such a way there are no resource sharing conflicts in the best-found test schedule and hopefully, test schedule constraints are met maximally at minimal time and TAM values.

Klíčová slova

test scheduling, power constraint, test access mechanism, sessionless, test application graph

Autoři

STRNADEL, J.

Rok RIV

2006

Vydáno

20. 4. 2006

Nakladatel

Czech Technical University Publishing House

Místo

Prague

ISBN

1-4244-0184-4

Kniha

Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

Strany od

161

Strany do

162

Strany počet

2

BibTex

@inproceedings{BUT22186,
  author="Josef {Strnadel}",
  title="Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space",
  booktitle="Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems",
  year="2006",
  pages="161--162",
  publisher="Czech Technical University Publishing House",
  address="Prague",
  isbn="1-4244-0184-4"
}