Publication detail

Noise Reliability Indicators for Films Resistors

SCHAUER, P.

Original Title

Noise Reliability Indicators for Films Resistors

Type

conference paper

Language

English

Original Abstract

Low frequency noise in thin film resistors is generated in the inter-grain regions and its noise spectral density and the frequency exponent of the 1/f a - like noise are sensitive to the technology of preparation of these samples. It is supposed that the noise spectral density at a frequency 10 Hz and the frequency exponent can be used to characterize the technology standard and its time stability. Ageing process was implemented and noisy samples proved to be less stable than low noise ones.

Keywords

Noise, Reliability, Indicator, Film Resistor

Authors

SCHAUER, P.

RIV year

2007

Released

4. 9. 2007

Publisher

CERM

Location

Brno

ISBN

978-80-7204-537-2

Book

Physical and Material Engineering 2007

Pages from

190

Pages to

193

Pages count

4

BibTex

@inproceedings{BUT29726,
  author="Pavel {Schauer}",
  title="Noise Reliability Indicators for Films Resistors",
  booktitle="Physical and Material Engineering 2007",
  year="2007",
  pages="190--193",
  publisher="CERM",
  address="Brno",
  isbn="978-80-7204-537-2"
}