Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
SCHAUER, P.
Originální název
Noise Reliability Indicators for Films Resistors
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Low frequency noise in thin film resistors is generated in the inter-grain regions and its noise spectral density and the frequency exponent of the 1/f a - like noise are sensitive to the technology of preparation of these samples. It is supposed that the noise spectral density at a frequency 10 Hz and the frequency exponent can be used to characterize the technology standard and its time stability. Ageing process was implemented and noisy samples proved to be less stable than low noise ones.
Klíčová slova
Noise, Reliability, Indicator, Film Resistor
Autoři
Rok RIV
2007
Vydáno
4. 9. 2007
Nakladatel
CERM
Místo
Brno
ISBN
978-80-7204-537-2
Kniha
Physical and Material Engineering 2007
Strany od
190
Strany do
193
Strany počet
4
BibTex
@inproceedings{BUT29726, author="Pavel {Schauer}", title="Noise Reliability Indicators for Films Resistors", booktitle="Physical and Material Engineering 2007", year="2007", pages="190--193", publisher="CERM", address="Brno", isbn="978-80-7204-537-2" }