Detail publikace

Noise Reliability Indicators for Films Resistors

SCHAUER, P.

Originální název

Noise Reliability Indicators for Films Resistors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Low frequency noise in thin film resistors is generated in the inter-grain regions and its noise spectral density and the frequency exponent of the 1/f a - like noise are sensitive to the technology of preparation of these samples. It is supposed that the noise spectral density at a frequency 10 Hz and the frequency exponent can be used to characterize the technology standard and its time stability. Ageing process was implemented and noisy samples proved to be less stable than low noise ones.

Klíčová slova

Noise, Reliability, Indicator, Film Resistor

Autoři

SCHAUER, P.

Rok RIV

2007

Vydáno

4. 9. 2007

Nakladatel

CERM

Místo

Brno

ISBN

978-80-7204-537-2

Kniha

Physical and Material Engineering 2007

Strany od

190

Strany do

193

Strany počet

4

BibTex

@inproceedings{BUT29726,
  author="Pavel {Schauer}",
  title="Noise Reliability Indicators for Films Resistors",
  booktitle="Physical and Material Engineering 2007",
  year="2007",
  pages="190--193",
  publisher="CERM",
  address="Brno",
  isbn="978-80-7204-537-2"
}