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KALOVÁ, I. HORÁK, K. HONEC, P.
Original Title
Complex Visual Analysis of SMD Devices
Type
conference paper
Language
English
Original Abstract
The aim of this article is to introduce possibilities of using of computer vision methods for inspection of SMD devices production. Several partial applications of device dimensions measuring and inspection of individual production processes are presented. Most of mentioned tasks require some specialized technique like 3D measuring, double exposure, particular way of lighting.
Keywords
SMD device, computer vision, visual system, production inspection
Authors
KALOVÁ, I.; HORÁK, K.; HONEC, P.
RIV year
2009
Released
25. 11. 2009
Publisher
DAAAM International
Location
Vienna, Austria 2009
ISBN
978-3-901509-70-4
Book
Annals of DAAAM for 2009 & Proceedings of the 20th International DAAAM Symposium
Pages from
233
Pages to
234
Pages count
2
BibTex
@inproceedings{BUT29772, author="Ilona {Janáková} and Karel {Horák} and Peter {Honec}", title="Complex Visual Analysis of SMD Devices", booktitle="Annals of DAAAM for 2009 & Proceedings of the 20th International DAAAM Symposium", year="2009", pages="233--234", publisher="DAAAM International", address="Vienna, Austria 2009", isbn="978-3-901509-70-4" }