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BELAVIČ, D. ROČAK, D. ŠIKULA, J. HROVAT, M. KOKTAVÝ, B. PAVELKA, J.
Original Title
Investigation of a possible correlation between current noise and long-term stability of thick-film resistors
Type
conference paper
Language
English
Original Abstract
In this paper possible correlation between current noise and long-term stability of thick-film resistors was investigated. .
Keywords
noise
Authors
BELAVIČ, D.; ROČAK, D.; ŠIKULA, J.; HROVAT, M.; KOKTAVÝ, B.; PAVELKA, J.
Released
22. 6. 2000
Publisher
IMAPS
Location
Praha
ISBN
80-238-5509-3
Book
Proc. European Microelectronics, Packaging and Interconnection Symposium
Pages from
464
Pages to
469
Pages count
6
BibTex
@inproceedings{BUT30974, author="Darko {Belavič} and Dubravka {Ročak} and Josef {Šikula} and Marko {Hrovat} and Bohumil {Koktavý} and Jan {Pavelka}", title="Investigation of a possible correlation between current noise and long-term stability of thick-film resistors", booktitle="Proc. European Microelectronics, Packaging and Interconnection Symposium", year="2000", pages="6", publisher="IMAPS", address="Praha", isbn="80-238-5509-3" }