Detail publikace

Investigation of a possible correlation between current noise and long-term stability of thick-film resistors

BELAVIČ, D. ROČAK, D. ŠIKULA, J. HROVAT, M. KOKTAVÝ, B. PAVELKA, J.

Originální název

Investigation of a possible correlation between current noise and long-term stability of thick-film resistors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In this paper possible correlation between current noise and long-term stability of thick-film resistors was investigated. .

Klíčová slova

noise

Autoři

BELAVIČ, D.; ROČAK, D.; ŠIKULA, J.; HROVAT, M.; KOKTAVÝ, B.; PAVELKA, J.

Vydáno

22. 6. 2000

Nakladatel

IMAPS

Místo

Praha

ISBN

80-238-5509-3

Kniha

Proc. European Microelectronics, Packaging and Interconnection Symposium

Strany od

464

Strany do

469

Strany počet

6

BibTex

@inproceedings{BUT30974,
  author="Darko {Belavič} and Dubravka {Ročak} and Josef {Šikula} and Marko {Hrovat} and Bohumil {Koktavý} and Jan {Pavelka}",
  title="Investigation of a possible correlation between current noise and long-term stability of thick-film resistors",
  booktitle="Proc. European Microelectronics, Packaging and Interconnection Symposium",
  year="2000",
  pages="6",
  publisher="IMAPS",
  address="Praha",
  isbn="80-238-5509-3"
}