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ŠKARVADA, P. MACKŮ, R. KOKTAVÝ, P. RAŠKA, M.
Original Title
Noise of Reverse Biased Solar Cells
Type
conference paper
Language
English
Original Abstract
The non-destructive testing and analysis of single crystal silicon solar cell is the focal point of our research. The noise spectroscopy and I-V curve measurement of reverse biased pn junction provide information that is connected with solar cell reliability and that provide for not only local defect characterization. We propose a new electric solar cell model, as a base for an enhanced noise model, which is in accordance with the experimentally obtained I-V curves. We suggest the physical nature of an unconventional behavior in reverse I-V characteristics, which is typical for solar cells without apparent local avalanche breakdowns.
Keywords
Solar cell, pn junction, noise
Authors
ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P.; RAŠKA, M.
RIV year
2009
Released
14. 6. 2009
Publisher
American Institute of Physics
Location
U.S.A.
ISBN
978-0-7354-0665-0
Book
Noise and Fluctuations ICNF2009
0094-243X
Periodical
AIP conference proceedings
Year of study
1129
Number
1
State
United States of America
Pages from
391
Pages to
394
Pages count
4
BibTex
@inproceedings{BUT35487, author="Pavel {Škarvada} and Robert {Macků} and Pavel {Koktavý} and Michal {Raška}", title="Noise of Reverse Biased Solar Cells", booktitle="Noise and Fluctuations ICNF2009", year="2009", journal="AIP conference proceedings", volume="1129", number="1", pages="391--394", publisher="American Institute of Physics", address="U.S.A.", isbn="978-0-7354-0665-0", issn="0094-243X" }