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Detail publikace
ŠKARVADA, P. MACKŮ, R. KOKTAVÝ, P. RAŠKA, M.
Originální název
Noise of Reverse Biased Solar Cells
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The non-destructive testing and analysis of single crystal silicon solar cell is the focal point of our research. The noise spectroscopy and I-V curve measurement of reverse biased pn junction provide information that is connected with solar cell reliability and that provide for not only local defect characterization. We propose a new electric solar cell model, as a base for an enhanced noise model, which is in accordance with the experimentally obtained I-V curves. We suggest the physical nature of an unconventional behavior in reverse I-V characteristics, which is typical for solar cells without apparent local avalanche breakdowns.
Klíčová slova
Solar cell, pn junction, noise
Autoři
ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P.; RAŠKA, M.
Rok RIV
2009
Vydáno
14. 6. 2009
Nakladatel
American Institute of Physics
Místo
U.S.A.
ISBN
978-0-7354-0665-0
Kniha
Noise and Fluctuations ICNF2009
ISSN
0094-243X
Periodikum
AIP conference proceedings
Ročník
1129
Číslo
1
Stát
Spojené státy americké
Strany od
391
Strany do
394
Strany počet
4
BibTex
@inproceedings{BUT35487, author="Pavel {Škarvada} and Robert {Macků} and Pavel {Koktavý} and Michal {Raška}", title="Noise of Reverse Biased Solar Cells", booktitle="Noise and Fluctuations ICNF2009", year="2009", journal="AIP conference proceedings", volume="1129", number="1", pages="391--394", publisher="American Institute of Physics", address="U.S.A.", isbn="978-0-7354-0665-0", issn="0094-243X" }