Publication detail

Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances

OHLÍDAL, I., FRANTA, D., OHLÍDAL, M., NAVRÁTIL, K.

Original Title

Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances

Type

journal article - other

Language

English

Original Abstract

A new efficient modication of the method enabling us to perform the optical characterization of non-absorbing and weakly absorbing thin films without using the absolute values of reflectances measured is presented. This modification is based on determining the values of the wavelengths corresponding to the points where the spectral dependences of reflectances of studied films measured for several angles of incidence touch the envelopes of maxima and minima of these spectral dependences. Using a simple formula containing the wavelengths mentioned one can evaluate the values of the thicknesses and spectral dependences of the refractive indices of the films analyzed.

Keywords

Thin films, Spectral reflectance, Optical parameters

Authors

OHLÍDAL, I., FRANTA, D., OHLÍDAL, M., NAVRÁTIL, K.

RIV year

2001

Released

1. 1. 2001

ISBN

0042-207X

Periodical

Vacuum

Year of study

61

Number

1

State

United Kingdom of Great Britain and Northern Ireland

Pages from

285

Pages to

289

Pages count

5

BibTex

@article{BUT39658,
  author="Ivan {Ohlídal} and Daniel {Franta} and Miloslav {Ohlídal} and Karel {Navrátil}",
  title="Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances",
  journal="Vacuum",
  year="2001",
  volume="61",
  number="1",
  pages="285--289",
  doi="10.1016/S0042-207X(01)00132-4",
  issn="0042-207X"
}