Detail publikace

Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances

OHLÍDAL, I., FRANTA, D., OHLÍDAL, M., NAVRÁTIL, K.

Originální název

Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

A new efficient modication of the method enabling us to perform the optical characterization of non-absorbing and weakly absorbing thin films without using the absolute values of reflectances measured is presented. This modification is based on determining the values of the wavelengths corresponding to the points where the spectral dependences of reflectances of studied films measured for several angles of incidence touch the envelopes of maxima and minima of these spectral dependences. Using a simple formula containing the wavelengths mentioned one can evaluate the values of the thicknesses and spectral dependences of the refractive indices of the films analyzed.

Klíčová slova

Thin films, Spectral reflectance, Optical parameters

Autoři

OHLÍDAL, I., FRANTA, D., OHLÍDAL, M., NAVRÁTIL, K.

Rok RIV

2001

Vydáno

1. 1. 2001

ISSN

0042-207X

Periodikum

Vacuum

Ročník

61

Číslo

1

Stát

Spojené království Velké Británie a Severního Irska

Strany od

285

Strany do

289

Strany počet

5

BibTex

@article{BUT39658,
  author="Ivan {Ohlídal} and Daniel {Franta} and Miloslav {Ohlídal} and Karel {Navrátil}",
  title="Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances",
  journal="Vacuum",
  year="2001",
  volume="61",
  number="1",
  pages="285--289",
  doi="10.1016/S0042-207X(01)00132-4",
  issn="0042-207X"
}