Publication detail
Noise and scanning by local illumination as reliability estimation for silicon solar cells
CHOBOLA, Z., IBRAHIM, A.
Original Title
Noise and scanning by local illumination as reliability estimation for silicon solar cells
Type
journal article - other
Language
English
Original Abstract
This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.
Key words in English
Solar cells, noise, homogeneity, reliability
Authors
CHOBOLA, Z., IBRAHIM, A.
RIV year
2001
Released
16. 3. 2001
ISBN
0219-4775
Periodical
Fluctuation and Noise Letters
Year of study
1
Number
1
State
Republic of Singapore
Pages from
L21
Pages count
6
BibTex
@{BUT70646
}