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VAČKÁŘ, J., BUMBÁLEK, L.
Original Title
Prognoses and planning in metrology, and the predition application
Type
journal article - other
Language
English
Original Abstract
One of the quantities which is monitored by the metrology of geometrical values is the structure appreciation of machined surfaces, particularly the shape of the surface profile. Spectral analysis of the surface profile is an important condition for prediction of functional properties of important component surfaces.
Key words in English
planning in metrology, description of planning operations, determination
Authors
RIV year
2002
Released
26. 2. 2000
ISBN
2000-1213
Year of study
28
Number
2
Pages from
269
Pages to
274
Pages count
6
BibTex
@article{BUT41054, author="Josef {Vačkář} and Leoš {Bumbálek}", title="Prognoses and planning in metrology, and the predition application", year="2000", volume="28", number="2", pages="6", issn="2000-1213" }