Publication detail

Prognoses and planning in metrology, and the predition application

VAČKÁŘ, J., BUMBÁLEK, L.

Original Title

Prognoses and planning in metrology, and the predition application

Type

journal article - other

Language

English

Original Abstract

One of the quantities which is monitored by the metrology of geometrical values is the structure appreciation of machined surfaces, particularly the shape of the surface profile. Spectral analysis of the surface profile is an important condition for prediction of functional properties of important component surfaces.

Key words in English

planning in metrology, description of planning operations, determination

Authors

VAČKÁŘ, J., BUMBÁLEK, L.

RIV year

2002

Released

26. 2. 2000

ISBN

2000-1213

Year of study

28

Number

2

Pages from

269

Pages to

274

Pages count

6

BibTex

@article{BUT41054,
  author="Josef {Vačkář} and Leoš {Bumbálek}",
  title="Prognoses and planning in metrology, and the predition application",
  year="2000",
  volume="28",
  number="2",
  pages="6",
  issn="2000-1213"
}