Publication detail

Monitoring of surface homogeneity of optical parameters of thin films.

URBÁNEK, M., ŠIKOLA, T., NEBOJSA, A., SPOUSTA, J., DITTRICHOVÁ, L., CHMELÍK, R., ZLÁMAL, J., JIRUŠE, J.

Original Title

Monitoring of surface homogeneity of optical parameters of thin films.

Type

conference paper

Language

English

Original Abstract

Monitoring of surface homogeneity of optical parameters of thin films

Key words in English

thin films

Authors

URBÁNEK, M., ŠIKOLA, T., NEBOJSA, A., SPOUSTA, J., DITTRICHOVÁ, L., CHMELÍK, R., ZLÁMAL, J., JIRUŠE, J.

RIV year

2001

Released

17. 4. 2000

Publisher

Editors: B. Michel, T. Winkler, M. Werner,H. Fecht

Location

Berlin

Pages from

604

Pages to

609

Pages count

6

BibTex

@inproceedings{BUT4155,
  author="Michal {Urbánek} and Tomáš {Šikola} and Alois {Nebojsa} and Jiří {Spousta} and Libuše {Dittrichová} and Radim {Chmelík} and Jakub {Zlámal} and Jaroslav {Jiruše}",
  title="Monitoring of surface homogeneity of optical parameters of thin films.",
  booktitle="Micromat 2000",
  year="2000",
  pages="6",
  publisher="Editors: B. Michel, T. Winkler, M. Werner,H. Fecht",
  address="Berlin"
}