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NOVOTNÝ, R.
Original Title
Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices
English Title
Type
journal article - other
Language
Czech
Original Abstract
Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here.
English abstract
Keywords
design, experiment, factor, multi-vari analysis, optimization, response, variation
Key words in English
Authors
RIV year
2008
Released
1. 1. 2008
Publisher
World Scientific and Engineering Academy and Society (WSEAS)
Location
Istanbul, Turkey
ISBN
1790-5117
Periodical
WSEAS Applied Informatics & Communications
Year of study
Number
1
State
Hellenic Republic
Pages from
105
Pages to
108
Pages count
4
BibTex
@article{BUT49206, author="Radovan {Novotný}", title="Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices", journal="WSEAS Applied Informatics & Communications", year="2008", volume="2008", number="1", pages="105--108", issn="1790-5117" }