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NOVOTNÝ, R.
Originální název
Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices
Anglický název
Typ
článek v časopise - ostatní, Jost
Jazyk
čeština
Originální abstrakt
Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here.
Anglický abstrakt
Klíčová slova
design, experiment, factor, multi-vari analysis, optimization, response, variation
Klíčová slova v angličtině
Autoři
Rok RIV
2008
Vydáno
1. 1. 2008
Nakladatel
World Scientific and Engineering Academy and Society (WSEAS)
Místo
Istanbul, Turkey
ISSN
1790-5117
Periodikum
WSEAS Applied Informatics & Communications
Ročník
Číslo
1
Stát
Řecká republika
Strany od
105
Strany do
108
Strany počet
4
BibTex
@article{BUT49206, author="Radovan {Novotný}", title="Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices", journal="WSEAS Applied Informatics & Communications", year="2008", volume="2008", number="1", pages="105--108", issn="1790-5117" }