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VANĚK, J., CHOBOLA, Z., BAŘINKA, R.
Original Title
Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools
Type
conference paper
Language
Czech
Original Abstract
Analyze of new production technology of photovoltaic cells contact by using I-V characteristic and noise spectroscopy.
Key words in English
Noise, contact, spectroscopy
Authors
Released
17. 9. 2002
Location
Prague
ISBN
80-01-02579-9
Book
Physical and Material Engineering 2002
Pages from
121
Pages to
122
Pages count
2
BibTex
@inproceedings{BUT5020, author="Jiří {Vaněk} and Radim {Bařinka} and Zdeněk {Chobola}", title="Low Frequency Noise and I-V Characteristic as Silicon Solar Cell Contact Characterization Tools", booktitle="Physical and Material Engineering 2002", year="2002", pages="2", address="Prague", isbn="80-01-02579-9" }